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X-ray fluorescence spectrometer (XRF)

The X-ray Fluorescence (XRF) Spectrometer is a premier analytical instrument for rapid, non-destructive elemental analysis. It allows for the precise determination of the chemical composition of a wide variety of materials, including solids, powders, liquids, and thin films, with minimal to no sample preparation.

Key Analytical Capabilities

Our XRF systems utilize Energy Dispersive X-ray Fluorescence (EDXRF) technology, offering a versatile solution for both qualitative screening and high-precision quantitative analysis.

  • Broad Elemental Range: Capable of detecting elements from Sodium (Na) to Uranium (U). Specialized configurations can extend this range down to Fluorine (F) or even Carbon (C) for light element analysis.
  • Non-Destructive Testing: The analysis does not consume or damage the sample. This is critical for high-value items such as gemstones, historical artifacts, and forensic evidence.
  • Trace Element Detection: Features high-sensitivity detectors that can identify trace concentrations at the parts-per-million (ppm) level, essential for identifying impurities and geographic origins.
  • Multi-Element Analysis: Simultaneously detects and quantifies multiple elements in a single measurement cycle, typically within 30 to 300 seconds.

Technical Features & Design

  • Advanced X-Ray Tube: Equipped with a high-stability X-ray tube (typically with a Rhodium or Silver anode) and adjustable voltage settings (up to 50 kV) to optimize excitation for different element groups.
  • High-Resolution Detection: Features a state-of-the-art Silicon Drift Detector (SDD). This liquid nitrogen-free detector provides excellent energy resolution and high count rates, ensuring precision even for complex matrices.
  • Large Sample Chamber: The spacious analytical chamber is designed to accommodate samples of various shapes and sizes. Optional automatic sample changers are available for high-throughput laboratory environments.
  • Integrated Imaging: A high-resolution built-in camera allows for precise sample positioning and “small-spot” analysis on specific areas of interest (down to 0.5 mm).
  • Vacuum & Helium Purge Options: Supports measurement in air, vacuum, or Helium-purged environments to enhance the sensitivity for light elements (like Al, Si, P, and S).

Technical Specifications

Parameter

Specification

Principle

Energy Dispersive X-ray Fluorescence (EDXRF)

Detectable Range

Na (11) to U (92) [Optional: F (9) to Am (95)]

X-Ray Source

50 W / 50 kV (Max) with Rh or Ag Anode

Detector Type

Silicon Drift Detector (SDD), Peltier Cooled

Energy Resolution

< 135 eV (at Mn K alpha)

Sample Atmosphere

Air, Vacuum, or Helium Purge

Interface

High-speed USB / Ethernet with dedicated PC software

 

Primary Applications

  • Gemology & Jewelry: Accurate determination of gold and silver fineness; identification of trace elements to distinguish natural from synthetic stones and detect treatments (e.g., lead-glass filling in rubies).
  • Metallurgy: Quality control for alloy composition and identification of tramp elements in scrap metal recycling.
  • Environmental Monitoring: Detection of heavy metals (Pb, As, Hg, Cd) in soil, water, and air particulates.
  • Petrochemicals: Monitoring sulfur and chlorine content in fuels and lubricants in compliance with ASTM and ISO standards.
  • Pharmaceuticals: Screening for elemental impurities in active pharmaceutical ingredients (APIs) and excipients.