The X-ray fluorescence spectrometer (XRF) is designed for express elemental analysis of solid and liquid samples by X-ray fluorescence with total external reflection. Due to the features of the X-ray optical scheme, detection limits reach tens of ppb.

This advanced elemental analyser detects concentrations from 10 ppb to 100% in solids and liquids. It requires minimal sample volume on glass slides, providing automated, reference-free quantitative results with precision.