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X-Ray Diffractometer (XRD)

The X-Ray Diffractometer (XRD) is a critical instrument for the non-destructive analysis of crystalline materials. By utilizing the principle of X-ray diffraction, it allows for precise identification of phase composition, crystal structure, and physical properties in materials ranging from powders and solids to thin films and liquids.

Core Technology & Design

Our XRD systems are built around a high-precision Vertical $\theta$-$\theta$ Goniometer. This design keeps the sample in a horizontal position at all times, making it ideal for the analysis of large, heavy, or liquid samples that would otherwise shift in a traditional $\theta$-2$\theta$ setup.

  • Advanced Goniometer Precision: Features an independent dual-axis drive with a minimum step size of 0.0001°, ensuring the highest level of angular reproducibility and data reliability.
  • High-Output X-Ray Generation: Equipped with a highly stable generator (up to 3 kW) that supports multiple tube types, including fine-focus and broad-focus anodes (Cu, Co, Cr, or Mo), providing the flexibility needed for different material densities.
  • Optical Versatility: The system can be switched between standard Bragg-Brentano focusing optics for routine powder analysis and Parallel Beam optics (via a polycapillary unit) for irregular surfaces, thin films, and curved samples.

Key Capabilities

  • Qualitative & Quantitative Phase Analysis: Rapidly identify unknown substances by comparing diffraction patterns against the ICDD database and perform precise quantification of multi-phase mixtures.
  • Crystallographic Characterization: Determine lattice constants, degree of crystallinity, crystallite size, and internal crystal strain with high accuracy.
  • Thin Film Analysis: Specialized grazing incidence (GIXRD) and reflectometry (XRR) modes allow for the measurement of layer thickness, density, and interface roughness in multilayered structures.
  • Environmental & Industrial Safety: Includes analysis packages for the detection of free silicic acids and asbestos in construction materials, and residual austenite quantification in metallurgy.
 

Technical Specifications

Parameter

Specification

Goniometer Geometry

Vertical theta (Sample remains horizontal)

Minimum Step Size

0.0001°

Angular Range (2 theta)

-6° to +132° (depending on configuration)

X-Ray Generator Power

2.2 kW to 3.0 kW (High-stability)

Standard Detector

High-speed scintillation or wide-range 1D/2D detector

Sample Size Capacity

Up to 400 mm (W) x 550 mm (D) x 400 mm (H)

Slew Speed

Up to 1000°/min

 

Safety and Software Integration

  • Radiation Protection: The instrument is housed in a fully lead-shielded enclosure with a fail-safe magnetic interlock system. X-ray generation is automatically disabled if the door is opened.
  • User-Friendly Control: Operated via a standard PC interface with integrated software for instrument control, peak search, Rietveld refinement, and automated data processing.
  • Automation Options: Supports automatic sample changers and environmental chambers for non-ambient studies (heating/cooling
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